Prediction and verification of wafer surface morphology in ultrasonic vibration assisted wire saw (UAWS) slicing single crystal silicon based on mixed material removal mode

نویسندگان

چکیده

Monocrystalline silicon slicing is the first step in making chips, and surface quality of wafers directly affects later processing accounts for a large proportion chip manufacturing cost. Ultrasonic vibration assisted wire saw (UAWS) an effective sawing process cutting hard brittle materials such as monocrystalline Si, which can significantly improve wafers. In order to further study formation mechanism morphology single crystal sliced by UAWS, new model prediction wafer UAWS based on mixed material removal mode presented verified experiments this paper. Firstly, diamond tool established equal probability method. Then, trajectory equation arbitrary abrasive particles derived analyzed. Thirdly, presented. Finally, experiment, effects parameters speed, feed workpiece rotate speed were studied. It shows that predicted experimental are similar some characteristics, average error between theoretical values roughness 11.9%, verifies validity model.

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ژورنال

عنوان ژورنال: The International Journal of Advanced Manufacturing Technology

سال: 2022

ISSN: ['1433-3015', '0268-3768']

DOI: https://doi.org/10.1007/s00170-022-09218-9